Ultrasonic NDT Equipment | Industrial Defect Detection Scanner

· Scanning Acoustic Microscopy
· Ac Hysteresisgraph
· Portable GC-MS
· Dc Hysteresisgraph
· Handheld X-Ray Backscatter Real Time Imaging System
· Portable X-Ray Scanning System

UST300A Scanning Acoustic Microscopy(SAM)
Scanning Acoustic Microscope is developed for inspection of the internal defect location, size and distribution in the semiconductor packages or materials using high frequency ultrasonic waves. It is very sensitive to bonding layer, so it can discover air holes, flaws, impurities and delaminations, etc.
Scanning Acoustic Microscope is a kind of non-destructive device which can display waveforms and high resolution images of the inner of inspected objects, and can reserve small defects lost in destructive inspection.
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